JDS Uniphase SWS2002-A-N1 Source Optics Module. Features: Reduces Production Test Cost ± 0.002 nm Absolute Wavelength Accuracy High Speed Scanning Distributed Architecture Up to 128 Detector Channels for Device Characterization The JDS Uniphase SWS2000 Series Swept Wavelength System is a fast, accurate and flexible test solution for characterizing the wavelength dependence of passive optical components. The SWS system consists of: a tunable laser source, a source optics module, a receiver chassis, a control module, and one or more detector modules and application software.